首页> 外国专利> METHOD FOR THE DETERMINATION OF THE PROPERTIES OF MATERIALS IN REFLECTION OR TRANSMISSION MEASUREMENTS WITH ELECTROMAGNETIC WAVES, IN PARTICULAR MICROWAVES

METHOD FOR THE DETERMINATION OF THE PROPERTIES OF MATERIALS IN REFLECTION OR TRANSMISSION MEASUREMENTS WITH ELECTROMAGNETIC WAVES, IN PARTICULAR MICROWAVES

机译:用电磁波(特定微波)测定反射或透射测量中材料的性能的方法

摘要

In a method for determining the phase shift in measurements of reflection or transmission with electromagnetic waves, in addition to a first reference measurement (empty measurement) for detecting the proportion of the measurement arrangement in the phase shift a second reference measurement is carried out on a representative sample, and the phase shift caused by this representative sample is firstly exactly determined. The phase responses caused by the samples or specimens to be measured are then treated as a deviation from the corresponding phase response or the phase shift of the representative sample, and taken into account by the formation of sums/differences, i.e. the actual phase shift of an individual sample is composed of the phase shift of the reference sample and a relative phase shift which is caused by the deviations of the individual specimen from the reference sample. By comparing the frequency responses for the individual sample/reference sample, the disturbing nonlinearities are largely eliminated in the phase responses occurring here, and thus a more exact determination of the phase shifts is rendered possible. IMAGE
机译:在用于确定电磁波反射或透射的测量中的相移的方法中,除了用于检测测量装置在相移中所占比例的第一参考测量(空测量)以外,还对第二测量进行第二参考测量。代表样本,并且首先精确确定由该代表样本引起的相移。然后,将要测量的样品或样品引起的相位响应视为与相应的相位响应或代表样品的相移之间的偏差,并通过求和/差的形成来考虑,即实际的相移。单个样品由参考样品的相移和相对相移组成,该相对相移是由单个样品与参考样品的偏差引起的。通过比较单个样本/参考样本的频率响应,可以大大消除此处出现的相位响应中的干扰非线性,因此可以更精确地确定相移。 <图像>

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