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Crystallite thickness determn. in polymers - by deflecting visible light passing through small polymer sample w.r.t. temp., measuring light intensity variation and calculating thickness distribution

机译：微晶厚度确定。在聚合物中-通过偏转穿过小聚合物样品的可见光w.r.t.温度，测量光强度变化并计算厚度分布

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Method is for determn. of both the crystallite thickness distribution of polymers and also the mean values. Light is passed through a sample of a given polymer, is slightly deflected and through variation of sample temp., changes in light intensity of visible light are recorded. Light components perpendicular to the oscillating direction of the primary beam of the deflected light is filtered out. The deflected light intensity values are differentiated and the resulting curve is subjected to a non-linear mathematical transformation to determine a relationship between melting pt. and crystallite thickness. Mean values of crystallite thickness distribution are calculated according to known formulae. USE/ADVANTAGE - The method is used to characterise polymers, esp. partially crystalline polymers, uses only small samples and is inexpensiv

机译：方法是确定的。聚合物的微晶厚度分布以及平均值。光穿过给定聚合物的样品，略微偏转，并通过样品温度的变化，记录可见光的光强度变化。垂直于偏转光的主光束的振荡方向的光分量被滤除。对偏转的光强度值进行微分，并对所得曲线进行非线性数学变换，以确定熔点之间的关系。和微晶厚度。根据已知的公式计算微晶厚度分布的平均值。使用/优势-该方法用于表征聚合物，尤其是。部分结晶的聚合物，仅使用少量样品且价格便宜

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公开/公告号DE4102807A1

专利类型
公开/公告日1992-08-06

原文格式PDF
申请/专利权人 LEUNA-WERKE AG O-4220 LEUNA DE;
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申请/专利号DE19914102807
发明设计人 WEYHE GOTTFRIED O-4200 MERSEBURG DE;DALCOLMO HANS-JOACHIM O-4090 HALLE-NEUSTADT DE;PIETZSCH HANS-RAINER DR. O-4200 MERSEBURG DE;
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申请日1991-01-31
分类号G01N33/44;G01N21/41;G01N15/02;G01N25/04;G01N21/21;
国家 DE
入库时间 2022-08-22 05:25:42

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