Apparatus for analysis by ellipsometry, procedure for ellipsometric analysis of a sample and application to the measurement of variations in the thickness of thin films

• 1. 用于制造椭圆芯保偏光纤的光纤预制棒及椭圆芯保偏光纤的制造工艺 [P] . 中国专利： CN110104945A . 2019-08-09
• 2. 制备液晶薄膜和椭圆偏光器的方法 [P] . 中国专利： CN100385271C . 2008.04.30
• 3. ELLIPSOMETRY ANALYZER, SAMPLE ELLIPSOMETRIC ANALYSIS METHOD, AND THIN FILM THICKNESS VARIATION MEASUREMENT MEASUREMENT [P] . 法国专利： FR2628211A1 . 1989-09-08

  机译： 椭偏分析仪，样品椭偏分析方法和薄膜厚度变化量测量

• 4. Device for ellipsometric analysis, method for the ellipsometric analysis of a sample, and use in the measurement of thickness variation of thin layers [P] . 欧洲知识产权局专利： EP0332508B1 . 1993-09-08

  机译： 椭偏分析设备，样本椭偏分析方法，以及用于测量薄层厚度变化的设备

• 5. Device for ellipsometric analysis, method for the ellipsometric analysis of a sample, and use in the measurement of thickness variation of thin layers [P] . 欧洲知识产权局专利： EP0332508A1 . 1989-09-13

  机译： 椭偏分析设备，样本椭偏分析方法，以及用于测量薄层厚度变化的设备

• 1. Measurement of a thin layers thickness using independent component analysis of ground penetrating radar data [J] . LI Xiang-tang, ZHANG Xiao-ning, WANG Duan-yi 哈尔滨工业大学学报（英文版） . 2008,第004期
• 2. Measurement of a thin layers thickness using independent component analysis of ground penetrating radar data [J] . 李想堂, 张肖宁, 王端宜 哈尔滨工业大学学报：英文版 . 2008,第004期
• 3. ANALYSIS OF VIBRATIONAL PROPERTIES OF THIN FILMS USING IN-SITU INFRARED ELLIPSOMETRY: APPLICATIONS TO POLYMERLIKE AMORPHOUS CARBON FILMS [C] . Symposium on plasma deposition and treatment of polymers . 1999
• 4. Design, development, and applications of image scanning ellipsometry for the measurement of thin film thickness profiles. [D] . Liu, An-Hong. 1994
• 5. Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry [O] . Daniel Lehmann, Falko Seidel, Dietrich RT Zahn -1
• 6. Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry [O] . Lehmann, Daniel, Seidel, Falko, Zahn, Dietrich R.T. 2014
• 7. Modeling Ellipsometry Measurements of Molecular Thin-Film Contamination on Genesis Array Samples [R] . Calaway, Michael J., Stansbery, E. K., McNamara, K. M. 2006

• 1. Poly-Si Thin Film Grown by Excimer Laser Crystallization and Its Ellipsometric Analysis [J] . ZENGXiang－bin ,XUZhong－yang ,等 . 半导体光子学与技术：英文版 . 2000,第2期
• 2. Photoluminescence and Structural Analysis of Samarium Doped TiOsub2/subThin Films and Their Applications to Visible LEDs [J] . M. Murayama ,K. Yoda ,K. Shiraishi . 光学与光子学期刊（英文） . 2018,第5期
• 3. Determination of Optimum Film Thickness and Composition of Cu(InAl)Sesub2/subThin Films as anAbsorber for Solar Cell Applications [J] . Balakrishnan Kavitha ,Muthusamy Dhanam . 纳米科学与工程（英文） . 2011,第4期
• 4. 椭圆偏振仪测量薄膜厚度和折射率 [C] . 马逊 ,刘祖明 ,陈庭金 . 第八届全国光伏会议暨中日光伏论坛 . 2004
• 5. 薄膜厚度的椭圆偏振光法测量 [A] . 王益朋 . 2010