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Sample evaluation system using thermal expansion deformation - using optical interference between reflected stimulation beam and reference beam with different frequency
Sample evaluation system using thermal expansion deformation - using optical interference between reflected stimulation beam and reference beam with different frequency
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机译：利用热膨胀变形的样品评估系统-利用反射刺激光束和不同频率参考光束之间的光学干涉
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摘要
The evaluation system uses the measured thermal expansion oscillation at the surface of the sample in response to a stimulation beam with an intensity which is periodically modulated at a given frequency. The stimulation beam has a optical frequency the reflected beam superimposed on a reference beam with a second optical frequency, the obtained interference converted into electrical signals. The latter are used to provide a beat signal with a frequency corresponding to the difference between the optical frequencies, converted into a binary signal allowing amplitude and phase evaluation.
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