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METHOD OF PREPARING HIGH-POROSITY QUARTZ FIBRE-BASE MATERIALS FOR QUANTITATIVE STUDIES USING OPTICAL AND/OR SCANNING ELECTRON MICROSCOPE
METHOD OF PREPARING HIGH-POROSITY QUARTZ FIBRE-BASE MATERIALS FOR QUANTITATIVE STUDIES USING OPTICAL AND/OR SCANNING ELECTRON MICROSCOPE
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机译:利用光学和/或扫描电子显微镜制备高孔隙度石英纤维基材料进行定量研究的方法
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the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to physical and chemical u0438u0441u0441u043bu0435u0434u043eu0432u0430u043du0438u00a0u043c in particular ways of sample preparation u0434u043bu00a0 structural studies using optical and u0440u0430u0441u0442u0440u043eu0432 oh, electron microscopy of invention can be used in studying the properties of the u0432u044bu0441u043eu043au043eu043fu043eu0440u0438u0441u0442u044bu0445 materials on the basis of the quartz fiber to u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 u00a0u0432u043bu00a0u0435u0442u0441u00a0 enhancing contrast of imaging surface of the image u0434u043bu00a0c u0432u044bu0441u043eu043au043eu043fu043eu0440u0438u0441u0442u043eu0433u043e material on the basis of the quartz fiber u043fu0440u043eu043fu0438u0442u044bu0432u0430u044eu0442 polymer after the polymerization u0441u0432u00a0u0437u0443u044eu0449u0438u043c and last manufacture thin section sample for u0441u0440u0430u0432 as compared with the prototype of the way to improve the contrast of images u043fu043eu0432u0441u0444 - u0445u043du043eu0441u0442u0438 u0448u043bu0438u0444u043eu0432 not less than twice 1 z p s - lu 3 silt with
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