首页> 外国专利> BIT ERROR RATE TESTING SYSTEM FOR DIGITAL SUBSCRIBER LINE

BIT ERROR RATE TESTING SYSTEM FOR DIGITAL SUBSCRIBER LINE

机译:数字用户线误码率测试系统

摘要

PURPOSE:To attain preventive maintenance for bit error rate test by providing an insulation resistance test circuit connecting line A-earth, line B-earth and between lines A-B to a test line of an intra-office line termination circuit via a DC resistor. CONSTITUTION:In closing a switch 8 in the insulation resistor test circuit 7, the lines A, B of the testlines are connected via the DC resistors as line A-earth, line B-earth and between lines A-B. As a result, the insulation resistance 13 of the digital subscriber line 4 is decreased by the connection of a DC resistor 9. In selecting the DC resistance properly and conducting the bit error rate test, the bit error rate of the digital subscriber line 4 whose insulation resistance 13 is not lowered is almost unchanged because the threshold margin of a test pulse is ensured sufficiently by the combined resistance. Thus, the preventive maintenance in the bit error rate test is attained.
机译:目的:通过提供绝缘电阻测试电路,通过直流电阻器将线A-地,线B-地以及线A-B之间连接到办公室内线路终端电路的测试线,从而获得预防误码测试的维护。构成:在闭合绝缘电阻测试电路7中的开关8时,测试线的A,B线通过直流电阻器连接为A-地线,B-地线以及A-B线之间。其结果是,数字用户线4的绝缘电阻13由DC电阻9的连接。在适当地选择的直流电阻和进行误码率测试中,数字用户线4,其的误比特率降低绝缘电阻13不会降低,因为通过组合电阻充分确保了测试脉冲的阈值裕度,所以几乎不变。因此,实现了误码率测试中的预防性维护。

著录项

  • 公开/公告号JPS63160453A

    专利类型

  • 公开/公告日1988-07-04

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19860306409

  • 发明设计人 KOJIMA KIMIFUMI;

    申请日1986-12-24

  • 分类号H04M3/30;

  • 国家 JP

  • 入库时间 2022-08-22 07:05:35

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号