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SELF-DIAGNOSIS CONTROLLING SYSTEM IN CASE OF RISE OF SYSTEM

机译:在系统兴起的情况下的自诊断控制系统

摘要

PURPOSE:To shorten a system rise time by checking whether a memory test skip instruction exists or not, in a memory test period, discontinuing its memory test, when it has become significant, and shifting the processing to an IPL. CONSTITUTION:When a power source of a system is turned on, an operating test of a principal LSI and its initializing are executed, and if it is normal, a memory test is executed. When executing the memory test, 16k bytes are one block, data is written (Write) to an effective memory size, its data is read out (Read), and this Read/Write data is compared. In this case, a key input for detecting a memory error and a memory test skip is checked at every 16k bytes. When checking the key input,, an interruption, etc. are used, whether the key input exists or not is checked by reading the contents of a specified flag (register area 23), and when the key input is detected, the memory test is discontinued, and the processing is shifted to an IPL.
机译:目的:通过检查是否存在内存测试跳过指令来缩短系统上升时间,在内存测试期间,当内存测试跳过指令变得很重要时,停止其内存测试,然后将处理转移到IPL。组成:打开系统电源时,将执行主体LSI的运行测试及其初始化,如果正常,则执行内存测试。执行存储器测试时,一个16k字节为一个块,将数据写入(写)为有效的存储器大小,将其数据读出(读),并比较此读/写数据。在这种情况下,每16k字节检查一次用于检测内存错误和内存测试跳过的键输入。在检查按键输入,中断等时,通过读取指定标志(寄存器区域23)的内容来检查按键输入是否存在,并且在检测到按键输入时,进行内存测试。中断,并且处理转移到IPL。

著录项

  • 公开/公告号JPS6182246A

    专利类型

  • 公开/公告日1986-04-25

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;TOSHIBA COMPUT ENG CORP;

    申请/专利号JP19840204255

  • 发明设计人 TSURU MASAFUMI;

    申请日1984-09-29

  • 分类号G06F12/16;G06F1/00;G06F9/445;G06F11/22;

  • 国家 JP

  • 入库时间 2022-08-22 07:44:38

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