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Signal error monolithic correction circuit - uses temp. sensor and microprocessor applying correction factor according to known temp. characteristics

机译:信号误差单片校正电路-使用温度传感器和微处理器根据已知温度应用校正因子。特点

摘要

The process provides automatic correction of signal errors arising because of a change in the temp. of an integrated circuit. The temp. of the circuit is measured by incorporating into the circuit junction (Q3) having the same geometry and electrical characteristics as the silicon transistors which form the operating circuit. The analogue signals from the circuit are transformed into digital form as is the signal from the temperature sensing junction. Taking into account the temperature characteristics of the circuit, a microprocessor performs correcting calculations on the signal provided by the integrated circuit. The microprocessor has access to memory space storing the data defining the temperature characteristics of the circuit. In particular the variation of amplifier gain with temperature may be taken into account.
机译:该过程可自动校正由于温度变化而引起的信号错误。集成电路。温度通过将具有与形成工作电路的硅晶体管相同的几何形状和电特性的电路结(Q3)并入电路结(Q3)中来测量电路的导通角。来自电路的模拟信号与来自温度感测结的信号一样转换为数字形式。考虑到电路的温度特性,微处理器对集成电路提供的信号进行校正计算。微处理器可以访问存储空间,该存储空间存储定义电路温度特性的数据。特别地,可以考虑放大器增益随温度的变化。

著录项

  • 公开/公告号FR2482381A1

    专利类型

  • 公开/公告日1981-11-13

    原文格式PDF

  • 申请/专利权人 HEATON JAMES;

    申请/专利号FR19800010227

  • 发明设计人

    申请日1980-05-07

  • 分类号H03F1/30;

  • 国家 FR

  • 入库时间 2022-08-22 12:29:56

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