首页> 外国专利> DELAY DIFFERENCE MEASURING METHOD FOR GROUP BETWEEN LP01 AND LP11 MODE BEAMS OF OPTICAL FIBER TO TRANSMIT LP01 AND LP11 MODE BEAMS

DELAY DIFFERENCE MEASURING METHOD FOR GROUP BETWEEN LP01 AND LP11 MODE BEAMS OF OPTICAL FIBER TO TRANSMIT LP01 AND LP11 MODE BEAMS

机译:光纤LP01和LP11模式光束之间的群传输LP01和LP11模式光束的延迟差测量方法

摘要

PURPOSE:To facilitate an easy measurement, by making the interference enable beams pass through the measured fiber for isolation into the LP01 and LP11 mode beams via the complex refraction polarizing element, giving the interference to these mode beams through the optical paths of different lengths and then measuring the group delay difference between both mode beams based on the optical path difference when the interference fringes becomes most clear. CONSTITUTION:Beam B which received the linear polarization and sent from light source 1 to emit interference enable beam A and interference enable light source 3 consisting of polarizer 2 enters via lens 4 measured optical fiber which transmits both the LP01 and LP11 mode beams. The radiation beam C is isolated into LP01 mode beam D and LP11 mode beam E via lens 6 and complex refraction polarizing element 7 each. Beam D is reflected by reflector 9 after passing through variable delay medium 8 to then enter compounder 10; while beam E enters compounder 10 via variable delay medium 11 and polarizer 11 each. Beam J which caused the interference at compounder 10 gives the interference fringes 14 onto projection secreen 13. Thus the group delay difference between the both mode beams of the measured optical fiber can be measured easily with a high accuracy based on the optical path difference when fringes 14 become most clear.
机译:用途:为便于测量,通过使干涉使光束能够通过复杂的折射偏振元件穿过被测光纤,并隔离为LP01和LP11模光束,从而通过不同长度和不同波长的光路对这些模光束产生干涉。然后在干涉条纹变得最清晰时,根据光程差测量两个模式光束之间的群时延差。组成:从光源1发出的线性偏振光束B发出干扰使能光束A,由偏振器2组成的干扰使能光源3经由透镜4进入测量的光纤,该光纤同时传输LP01和LP11模式光束。辐射束C分别经由透镜6和复折射偏振元件7被隔离成LP01模式光束D和LP11模式光束E。光束D在穿过可变延迟介质8之后,被反射器9反射,然后进入复合器10;而光束E分别通过可变延迟介质11和偏振器11进入复合器10。在混配器10处引起干涉的光束J将干涉条纹14投射到投影筛13上。因此,基于条纹时的光程差,可以轻松,高精度地测量被测光纤的两个模式光束之间的群延迟差。 14变得最清晰。

著录项

  • 公开/公告号JPS5650213B2

    专利类型

  • 公开/公告日1981-11-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号JP19790070329

  • 发明设计人

    申请日1979-06-04

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-22 13:58:06

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