首页> 外国专利> Optical interference measurement using multiple mode wave-guide - has conductive and dielectric layers with two laser beams fed in to produce interference energy pattern to activate photodiode array

Optical interference measurement using multiple mode wave-guide - has conductive and dielectric layers with two laser beams fed in to produce interference energy pattern to activate photodiode array

机译:使用多模波导的光学干涉测量-具有导电层和介电层,并注入了两个激光束,以产生干涉能量图案来激活光电二极管阵列

摘要

The multiple mode wave guide comprises a carrier (1), a wave conductor (2) and dielectric film top coating (3), the reflective index of which is less than that of the wave conductor. At one end of the wave-guide is fitted a coupling grid (4). A first laser beam (5), operating in the TE(O) mode is fed into the wave conductor. A second laser beam , (6), is introduced and develops a wave operating in the TE(1) mode. The wave conductor required to have characteristics such that the effective refractive indices in the TE(O) and TE(1) modes have a very small difference, and thus the two waves interfere and produce energy peaks which may be detected by an array of photodiodes (9-16). The device may be used for small angle or displacement measurements.
机译:多模波导包括载体(1),波导体(2)和电介质膜顶部涂层(3),其反射率小于波导体的反射率。在波导的一端装有耦合栅(4)。以TE(O)模式工作的第一激光束(5)被馈入波导管。引入第二束激光(6)并产生以TE(1)模式运行的波。所需的波导管必须具有在TE(O)和TE(1)模式下的有效折射率具有很小的差异的特性,因此这两个波会相互干扰并产生能量峰,这些峰可由光电二极管阵列检测到(9-16)。该设备可用于小角度或位移测量。

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