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Additional appts. for an interference spectrometer - giving interference fringes specific to gases under investigation, e.g. sulphur dioxide in pollutant gases
Additional appts. for an interference spectrometer - giving interference fringes specific to gases under investigation, e.g. sulphur dioxide in pollutant gases
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机译：其他appts。用于干涉光谱仪-给出特定于所研究气体的干涉条纹，例如污染物气体中的二氧化硫
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摘要
The additional appts. enables interference fringes to be specific to the gas under investigation, e.g. SO2, NO2 or its derivs. in pollutant gases. It includes a source, typically xenon, a polariser, an interferometer, an analyser, a viewer for the fringes and a photomultiplier plus various adjustment techniques for the polariser and analyser. A specific claim of the appts. is that it can provide quantitative detection of gaseous atmospheric pollutants. Various arrangements of optical items are possible. The interferometer can be made of a pair of opposing wedge prisms (enabling the effective thickness to be varied) a low angle Wollaston prism, an analyser and receiver, plus a fixed grill on the outlet face of the Wollaston prism for viewing the fringes obtd.
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