首页> 外国专利> A method for measuring the thickness and the deviations in thickness of a in a microtome cut portion, as well as a method for the production of thick changes of the section

A method for measuring the thickness and the deviations in thickness of a in a microtome cut portion, as well as a method for the production of thick changes of the section

机译:测量切片机切割部分的厚度和厚度偏差的方法,以及产生切片厚变的方法

摘要

An apparatus for cutting microtome specimen sections employs electro-mechanical transducer means connected to the specimen holder, or the knife, to generate an electrical signal during the cutting which indicates the uniformity, or any variations in the uniformity of the thickness of the section.
机译:用于切割切片机样本切片的设备采用连接至样本保持器或刀的机电换能器装置,以在切割期间产生电信号,该信号指示切片厚度的均匀性或均匀性的任何变化。

著录项

  • 公开/公告号DE000002231725C

    专利类型

  • 公开/公告日1974-07-11

    原文格式PDF

  • 申请/专利权人 LKB-PRODUKTER AB BROMMA (SCHWEDEN);

    申请/专利号DE2231725A

  • 发明设计人 RAUTIO ESKIL;WIKEFELDT PER;

    申请日1972-06-28

  • 分类号G01N1/06;

  • 国家 DE

  • 入库时间 2022-08-23 05:38:25

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