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A method of and a device for a quick measurement of inductance, capacity and resonance frequency of tuned circuits with a small quality factor
A method of and a device for a quick measurement of inductance, capacity and resonance frequency of tuned circuits with a small quality factor
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机译：一种以小品质因数快速测量调谐电路的电感，电容和谐振频率的方法和装置
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661,321. Impedance and Q-value measurements. TESLA, NATIONAL CORPORATION, and CAUNIOL, B. May 18, 1949 [May 20, 1948], No. 13277/49. Class 37. Impedances are measured by forming an undamped tuned circuit and exciting free oscillations therein by periodic impulses, the oscillating voltage produced being fed into a mixer into which are also fed oscillations from a reference generator, so that a difference frequency is produced which is measured. An inductance Lx to be measured is connected to the terminals AB of a pulse generator I in parallel with a fixed condenser and a variable condenser Cn. The oscillating voltage produced in this tuned circuit is supplied through a low-capacity Cv to a diode D, the D.C. component, indicating the Q-value, being measured by an instrument M1. The high-frequency component is fed through a separator II to a mixer III, into which also is fed the oscillation voltage from a reference generator IV. The diode D and instrument M1 may be omitted if a simultaneous measure of Q-value is not necessary. A difference frequency is produced in the mixer III and is indicated by a magic eye M2 and a loud-speaker T. This beat frequency is reduced to zero by varying the capacity of the condenser Cn, which is calibrated to indicate the value of the inductance or its deviation from the desired value.
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