Aperture equipment for electron beam, in particular objective - aperture diaphragm for electrons by means of microscopes

• 1. 孔径光阑系统、电子束曝光装置和电子束曝光装置系统 [P] . 中国专利： CN109917621A . 2019-06-21
• 2. 扫描电子显微镜装置和电子束检测设备 [P] . 中国专利： CN113471042A . 2021-10-01
• 3. Aperture equipment for electron beam, in particular objective - aperture diaphragm for electrons by means of microscopes. [P] . 德国专利： DE1649387U . 1953-01-15

  机译： 电子束的孔径设备，特别是物镜-利用显微镜的电子孔径光阑。

• 4. Diaphragm for electronic equipment to rays, in particular in the aperture diaphragm of the objective lens for electronic miscroscopes [P] . 法国专利： FR1041046A . 1953-10-20

  机译： 电子设备的隔膜，尤其是电子显微镜的物镜孔径光阑中的射线

• 5. Illumination device for measuring microscope - uses light-source, two collectors, glass plate, objective, image field aperture, beam-splitter, opto-electronic sensors and ocular [P] . 德国专利： DE3931919A1 . 1990-07-05

  机译： 测量显微镜的照明装置-使用光源，两个收集器，玻璃板，物镜，像场孔径，分束器，光电传感器和目镜

• 1. A COMPARISON OF SOME ELECTRONIC COUNTERMEASURES ON INVERSE SYNTHETIC APERTURE RADAR (ISAR) [J] . Fan Luhong, Pi Yiming, Huang Shunji, 电子科学学刊（英文版） . 2006,第001期
• 2. A COMPARISON OF SOME ELECTRONIC COUNTERMEASURES ON INVERSE SYNTHETIC APERTURE RADAR （ISAR） [J] . Fan, Luhong, Pi, 电子科学学刊：英文版 . 2006,第001期
• 3. Effects of electron trapping on nonlinear electron-acoustic waves excited by an electron beam via particle-in-cell simulations [J] . A A ABID, Quanming LU, Huayue CHEN, 等离子体科学和技术（英文版） . 2019,第005期
• 4. A novel method of lens initial structure selection: study on structures-aperture relationship of finite image distance achromatic spherical microscope objective with larger numerical aperture [C] . Liu na, Zhang Yimo, Fang Fengzhou Conference on Optical Design and Testing . 2008
• 5. Highly Integrated 2D Ultrasonic Arrays and Electronics for Modular Large Apertures [D] . Wodnicki, Robert. 2020
• 6. Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopy [O] . Bart Buijsse, Frank van Laarhoven, Andreas K. Schmid, -1
• 7. Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture [O] . S. Morishita, J. Yamasaki, N. Tanaka 2011

• 1. Intensity Distribution of the Finite Olver Beams through a Paraxial ABCD Optical System with an Aperture of Basis Annular Aperture [J] . Salima Hennani ,Lahcen Ez-Zariy ,Abdelmajid Belafhal . 光学与光子学期刊（英文） . 2015,第12期
• 2. Comparing Nasal Cavity Radiotherapy Using Electron, Photon, Proton and Photon-Electron Beams [J] . Navid Khaledi ,Foad Goli Ahmadabad ,Susan Ebam . 癌症治疗（英文） . 2018,第3期
• 3. 透射电子显微镜中可控纳米精度电子束刻蚀与原位电学输运性质测量 [C] . 张超 ,徐强 ,吴梦月 . 2013年全国电子显微学学术会议 . 2013
• 4. 变焦显微镜物镜驱动控制系统设计 [A] . 郭锞 . 2017