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Semiconductor package with reduced parasitic coupling effects and process for making the same

机译:半导体封装,具有降低的寄生耦合效果和制造方法

摘要

The present disclosure relates to a semiconductor package with reduced parasitic coupling effects, and a process for making the same. The disclosed semiconductor package includes a thinned flip-chip die and a first mold compound component with a dielectric constant no more than 7. The thinned flip-chip die includes a back-end-of-line (BEOL) layer with an upper surface that includes a first surface portion and a second surface portion surrounding the first surface portion, a device layer over the upper surface of the BEOL layer, and a buried oxide (BOX) layer over the device layer. The BEOL layer includes a first passive device and a second passive device, which are underlying the first surface portion and not underlying the second surface portion. Herein, the first mold compound component extends through the BOX layer and the device layer to the first surface portion.
机译:本公开涉及一种具有降低的寄生耦合效果的半导体封装,以及制造该半导体封装。所公开的半导体封装包括薄的倒装芯片管芯和具有介电常数的第一模具化合物组件不大于7.稀释的倒装芯片管芯包括带有上表面的后端线(BEOL)层包括第一表面部分和围绕第一表面部分的第一表面部分,在BEOL层的上表面上的装置层,以及在装置层上的掩埋氧化物(盒)层。 BEOL层包括第一被动装置和第二被动装置,其底层是第一表面部分并且不包括在第二表面部分下面。这里,第一模具化合物组分延伸穿过箱层和器件层到第一表面部分。

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