首页> 外国专利> ARRAY OF THREE-GATE FLASH MEMORY CELLS WITH INDIVIDUAL MEMORY CELL READ, PROGRAM AND ERASE

ARRAY OF THREE-GATE FLASH MEMORY CELLS WITH INDIVIDUAL MEMORY CELL READ, PROGRAM AND ERASE

机译:三门闪存单元数组,具有单个内存单元格读取,程序和擦除

摘要

A memory device comprising a substrate of semiconductor material and a plurality of memory cells formed on the substrate and arranged in an array of rows and columns, and a method of erasing the same. Each of the memory cells has a spaced apart source and drain region of the substrate, a channel region of the substrate extending between the source region and the drain region, a floating gate, drain region disposed over and insulated from a first portion of the channel region adjacent the source region; a select gate disposed over and insulated from the second portion of the channel region adjacent to , and a program-erase gate disposed over and insulated from the source region. The program-erase gate lines, alone or in combination with select gate lines or source lines, are arranged in a column direction, allowing each memory cell to be programmed, read, and erased individually.
机译:包括半导体材料基板的存储器件和形成在基板上的多个存储器单元,并布置在行和列阵列中,以及擦除相同的方法。每个存储器单元具有基板的间隔开放的源极和漏极区,源区和漏区之间延伸的基板的沟道区,浮栅,漏极区域,设置在通道的第一部分上和绝缘。邻近源区的区域;从邻近的沟道区域的第二部分设置和设置的选择栅极,以及设置在源区和绝缘的程序擦除栅极。程序擦除栅极线,单独或与选择栅极线或源线组合的栅极线以列方向排列,允许单独编程,读取和擦除每个存储器单元。

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