首页>
外国专利>
ENDPOINT DETECTION IN MANUFACTURING PROCESS BY NEAR INFRARED SPECTROSCOPY AND MACHINE LEARNING TECHNIQUES
ENDPOINT DETECTION IN MANUFACTURING PROCESS BY NEAR INFRARED SPECTROSCOPY AND MACHINE LEARNING TECHNIQUES
展开▼
机译：近红外光谱和机器学习技术的制造过程中的端点检测
展开▼
页面导航
摘要
著录项
相似文献
摘要
A device may receive training spectral data associated with a manufacturing process that transitions from an unsteady state to a steady state. The device may generate, based on the training spectral data, a plurality of iterations of a support vector machine (SVM) classification model. The device may determine, based on the plurality of iterations of the SVM classification model, a plurality of predicted transition times associated with the manufacturing process. A predicted transition time, of the plurality of predicted transition times, may identify a time, during the manufacturing process, that a corresponding iteration of the SVM classification model predicts that the manufacturing process transitioned from the unsteady state to the steady state. The device may generate, based on the plurality of predicted transition times, a final SVM classification model associated with determining whether the manufacturing process has reached the steady state.
展开▼
