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A SYSTEM AND A METHOD FOR OBTAINING A PERFORMANCE METRIC OF A DEVICE UNDER TEST BASED ON ONE OR MORE NEARFIELD MEASUREMENT RESULTS
A SYSTEM AND A METHOD FOR OBTAINING A PERFORMANCE METRIC OF A DEVICE UNDER TEST BASED ON ONE OR MORE NEARFIELD MEASUREMENT RESULTS
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机译：一种系统和用于基于一个或多个近场测量结果的测试性能度量的方法和方法
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摘要
An apparatus is provided for obtaining a mapping, for deriving a performance metric of a device under test based on one or more nearfield measurement results determined by using the DUT under consideration. The apparatus is configured to obtain training performance metrics or reference performance metrics, which are based on far-field measurements of a plurality of training DUTs, and based on one or more nearfield measurement results of the training DUTs. The apparatus is further configured to obtain or define the mapping based on the training performance metrics and based on the one or more nearfield measurement results, such that an output of the mapping provided in response to the one or more nearfield measurement results approximate the training performance metrics.
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