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Particle diameter measuring method, particle diameter measuring device and particle diameter measuring program

机译:粒径测量方法,粒径测量装置和粒径测量程序

摘要

Problem to be solved: to provide an appropriate measuring time according to the particle diameter to be measured and to provide a particle diameter measuring method, a particle diameter measuring apparatus, and a particle diameter measuring program with no wasted measurement time.A method of measuring particle diameterLight is applied to the sample during a test measurement time that includes a preset plurality of measurement timings.A test measurement step for measuring the measured measurement intensity of scattered light scattered by a specimen andAn autocorrelation function calculation step to calculate autocorrelation function which expresses the relation between self correlation of test measurement intensity and timeOn the basis of the time required for the auto correlation function to fall below a predetermined threshold and to be added to the timeA set step for setting a measurement timing used for this measurement among a plurality of preset measurement timings andDuring this measurement time, including some measurement timingsThis measurement step for measuring the measured intensity of scattered light andThe particle diameter calculation step to calculate the particle diameter of the sample based on this measurement intensity..Diagram
机译:要解决的问题:提供根据待测粒径的适当测量时间,并提供粒径测量方法,粒径测量装置和粒径测量程序,没有浪费测量时间。测量方法在测试测量时间期间将粒径闪光灯施加到样品,该测试测量时间包括预设的多个测量定时。用于测量由标本和ANAN自相关函数计算步骤散射的散射光的测量光度的测量测量强度,以计算表达的自相关函数测试测量强度的自相关与超时的基于预定阈值的时间的基于预定阈值,并将其添加到定时设置步骤,用于设置多个预设中的用于该测量的测量定时测量定时和发挥作用测量时间,包括一些测量时序测量步骤,用于测量散射光的测量强度和粒径计算步骤,以根据该测量强度计算样品的粒径..diagram

著录项

  • 公开/公告号JP2021165651A

    专利类型

  • 公开/公告日2021-10-14

    原文格式PDF

  • 申请/专利权人 大塚電子株式会社;

    申请/专利号JP20200068347

  • 发明设计人 若山 育央;

    申请日2020-04-06

  • 分类号G01N15/02;G01N21/53;

  • 国家 JP

  • 入库时间 2022-08-24 21:42:14

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