首页> 外国专利> INTERACTION DEPTH MEASUREMENT METHOD AND INTERACTION DEPTH MEASUREMENT DEVICE OF GAMMA RADIATION FOR RADIATION DETECTOR BASED ON ENERGY SEPARATION

INTERACTION DEPTH MEASUREMENT METHOD AND INTERACTION DEPTH MEASUREMENT DEVICE OF GAMMA RADIATION FOR RADIATION DETECTOR BASED ON ENERGY SEPARATION

机译:基于能量分离的辐射检测器伽马辐射的相互作用深度测量方法和相互作用深度测量装置

摘要

The present invention can improve the spatial resolution by measuring the position where the scintillator and the radiation interact in a radiation detection device such as a positron emission tomography device, thereby improving the resolution of a system or facility with improved spatial resolution. It relates to a radiation (gamma-ray) response depth measurement method for a radiation detection device based on energy separation and a radiation (gamma-ray) response depth measurement device. According to the present invention, there is provided an apparatus for measuring a reaction depth of radiation in a radiation detector, comprising: a scintillator module configured to generate signals generated for radiation differently; an optical sensor module for acquiring the generated signal generated by the scintillator module; and a reaction depth measurement module for measuring the reaction depth of radiation by extracting a position where the radiation and the scintillator reacted based on the generated signal obtained from the optical sensor module; provided
机译:本发明可以通过测量闪烁体和辐射在诸如正电子发射断层摄影装置的辐射检测装置中相互作用的位置来改善空间分辨率,从而提高了具有改进的空间分辨率的系统或设施的分辨率。它涉及一种基于能量分离和辐射(伽马射线)响应深度测量装置的辐射检测装置的辐射(伽马射线)响应深度测量方法。根据本发明,提供了一种用于测量辐射检测器中辐射的反应深度的装置,包括:闪烁体模块,被配置为产生不同地产生用于辐射的信号;用于获取由闪烁器模块产生的产生的信号的光学传感器模块;和反应深度测量模块,用于通过提取辐射和闪烁体基于从光学传感器模块获得的产生的信号反应的位置来测量辐射的反应深度;假如

著录项

  • 公开/公告号KR102340521B1

    专利类型

  • 公开/公告日2021-12-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020200002602

  • 发明设计人 백철하;이승재;

    申请日2020-01-08

  • 分类号G01T1/20;G01T1/202;G01T1/29;

  • 国家 KR

  • 入库时间 2022-08-24 22:55:18

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