首页> 外国专利> Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory array

Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory array

机译:用于内存阵列的汉际差分分析仪和存储器阵列中汉颌间差异测量和测试方法

摘要

An inter-hamming difference analyzer for a memory array having a plurality of sections is provided. The inter-hamming difference analyzer includes a controller, a storage device and a comparator. The controller is configured to obtain contents of the plurality of sections operating in a first operating condition and a second operating condition. The storage device is configured to store the contents of the plurality of sections corresponding to the first operating condition. The comparator is configured to obtain a plurality of inter-hamming differences of the plurality of sections according to the number of unlike bits between the content of a first section of the plurality of sections corresponding to the second operating condition and the contents of a plurality of sections other than the first section stored in the storage device.
机译:提供了一种用于具有多个部分的存储器阵列的汉耳间差分分析器。 汉字间差分分析器包括控制器,存储设备和比较器。 控制器被配置为在第一操作条件和第二操作条件下获得操作的多个部分的内容。 存储设备被配置为存储与第一操作条件对应的多个部分的内容。 比较器被配置为根据与第二操作条件的多个部分的第一部分的内容与多个部分的第一部分的内容之间的比特之间的多个部分获得多个部分的多个汉语差异。 除了存储在存储设备中的第一部分之外的部分。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号