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ORIENTATION DISTRIBUTION CALCULATION METHOD, ORIENTATION DISTRIBUTION ANALYSIS DEVICE, AND ORIENTATION DISTRIBUTION ANALYSIS PROGRAM
ORIENTATION DISTRIBUTION CALCULATION METHOD, ORIENTATION DISTRIBUTION ANALYSIS DEVICE, AND ORIENTATION DISTRIBUTION ANALYSIS PROGRAM
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机译：取向分布的计算方法,取向分布分析设备和取向分布分析程序
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摘要
An orientation degree distribution analysis method of the present invention includes steps of: inputting crystal structure information of an object to be measured, information on an intensity ratio of each diffraction peak and a crystal plane corresponding to each diffraction peak by X-ray diffraction measurement, information on a diffraction range and diffraction sensitivity, and an intensity ratio of each diffraction peak of a randomly oriented sample to a main storage device; calculating an angle formed by an orientation plane and a crystal plane corresponding to the diffraction peak of interest from the information stored in the main storage device in the step; calculating an existence ratio and storing the existence ratio in the main storage device; setting an orientation degree distribution function; and calculating an orientation degree distribution from the information of the input step and the calculation step. As a result, there are provided a method of easily calculating an orientation degree distribution from an X-ray diffraction profile by using an information processing apparatus and a calculation program without requiring complicated pretreatment of a sample as in an EBSD method, and a method of obtaining a spatial map of the orientation degree distribution from a plurality of diffraction intensity maps obtained by using a micro-focal X-ray.
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