Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator

著录项

• 来源
  《16th Asian Test Symposium》|2007年|271-274|共4页
• 会议地点 Beijing(CN);Beijing(CN)
• 作者

  Donghai Li; rnBin Ai; rnXia Li; rnQiusheng Wu; rnXiaoguang Xie;

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• 作者单位

  Yoshinobu Higami@Graduate School of Science and Engineering, Ehime University Dept. of Electrical and Computer Engineering, University of Wisconsin-Madison--Kewal K. Saluja@Graduate School of Science and Engineering, Ehime University Dept. of Electrical and Computer Engineering, University of Wisconsin-Madison--Hiroshi Takahashi@Graduate School of Science and Engineering, Ehime University Dept. of Electrical and Computer Engineering, University of Wisconsin-Madison--Shin-ya Kobayashi@Graduate School of Science and Engineering, Ehime University Dept. of Electrical and Computer Engineering, University of Wisconsin-Madison--Yuzo Takamatsu@Graduate School of Science and Engineering, Ehime University Dept. of Electrical and Computer Engineering, University of Wisconsin-Madison--;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 调整、测试;
• 关键词