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Local study of a double hetero-junction laser diode by apertureless scanning near-field optical microscopy

机译:无孔扫描近场光学显微镜对双异质结激光二极管的局部研究

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Abstract: We studied locally a double hetero-junction GaAs/GaAlAs laser diode by apertureless Scanning Near-field Optical Microscopy. The optical probe used is a tungsten tip vibrating (at frequency f) perpendicularly to the emitting surface. Suitable experimental parameters permitting us to accede to near-field information have been defined. Their respective importance in the extraction of near-field information is shown and discussed.!5
机译:摘要:我们通过无孔扫描近场光学显微镜在本地研究了双异质结GaAs / GaAlAs激光二极管。所使用的光学探头是垂直于发射表面振动(频率为f)的钨尖端。已经定义了允许我们加入近场信息的合适实验参数。显示并讨论了它们各自在提取近场信息中的重要性。!5

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