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首页> 外文会议>1st International Conference on Semiconductor Technology Vol.1, May 27-30, 2001, Shanghai, China >ACCEPTANCE SAMPLING SCHEMES FOR CAT1 CHIP EFR INSPECTION
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ACCEPTANCE SAMPLING SCHEMES FOR CAT1 CHIP EFR INSPECTION

机译：CAT1芯片EFR检查的验收抽样方案

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摘要

A semiconductor chip that passes all parametric tests, multiprobe yield tests, and outlier criteria is defined as a category 1 (Catl) chip. Catl chips are the majority chips qualified for delivery to the customers. The customer has an early failure rate (EFR) requirement on the chips. In order to meet this quality requirement, the manufacturer needs to apply a statistical sampling scheme to assure very low risk to the customer and high confidence to the manufacturer before delivering the products. The scheme requires selecting a sample for burn-in test from a batch of Catl chips. Based on burn-in test result, the manufacturer determines either to ship the whole batch without further burn-in or 100 percent burn-in the rest of the chips in the batch. This project is to design acceptance sampling schemes for Catl chips of all semiconductor devices to meet quality requirement and optimize burn-in capacity. The optimization includes minimizing the average burn-in size per batch, reducing consumer's risk and enhancing manufacturer's confidence in delivering chips confined to the predetermined quality levels.
机译：通过所有参数测试，多探针良率测试和离群标准的半导体芯片被定义为1类（Catl）芯片。 Catl芯片是有资格交付给客户的大多数芯片。客户对芯片有早期故障率（EFR）的要求。为了满足此质量要求，制造商需要采用统计抽样方案，以确保在交付产品之前对客户的风险非常低，对制造商的信任度很高。该方案需要从一批Catl芯片中选择一个样品进行老化测试。根据老化测试结果，制造商决定不进行进一步老化就装运整个批次，或者将批次中的其余芯片100％老化。该项目旨在为所有半导体器件的Catl芯片设计验收采样方案，以满足质量要求并优化老化能力。优化包括最小化每批的平均烙印尺寸，降低消费者的风险并增强制造商对交付限定质量水平的芯片的信心。

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