A STUDY OF THE EFFECT OF SURFACE METALIZATION ON THE THERMAL CONDUCTIVITY MEASUREMENTS BY THE TRANSIENT THERMO-REFLECTANCE METHOD

机译：瞬态热反射法研究表面金属化对热导率的影响

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摘要

This work is a numerical and experimental investigation of the effect of the use of a metallic absorption layer on the laser-based measurements of the thermal conductivity of dielectric, semiconductor, and highly-conductive materials. The numerical and supporting experimental results reveal the presence of behaviors associated with thermally-thin and thermally-thick absorption layers, depending on the ratio between the thickness of the absorption layer and the heat penetration depth. It is concluded that the TTR method performs optimally when the thickness of the metalization layer falls in the transition range between the identified thermally-thin and thermally-thick layers.

机译：这项工作是对金属吸收层的使用对基于激光的电介质，半导体和高导电材料导热系数测量的影响的数值和实验研究。数值和辅助实验结果表明，取决于吸收层的厚度与热穿透深度之间的比值，存在与热薄和热厚吸收层相关的行为。结论是，当金属化层的厚度落在所确定的热薄层和热厚层之间的过渡范围内时，TTR方法的性能最佳。

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来源
《2002 ASME International Mechanical Engineering Congress and Exposition , Nov 17-22, 2002, New Orleans, Louisiana》|2002年|p.179-182|共4页
会议地点 New Orleans LA(US);New Orleans LA(US)
作者
Mihai G. Burzo; Pavel L. Komarov; Peter E. Raad;
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作者单位

Mechanical Engineering Department, Southern Methodist University Dallas, Texas 75275-0337, USA;

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会议组织
原文格式 PDF
正文语种 eng
中图分类能源与动力工程;
关键词
thermoreflectance; thin films; absorption layer; semiconductor; experimental; computational; heat transfer;

机译：热反射率薄膜；吸收层半导体;实验计算传播热量;

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1. A Study of the Effect of Surface Metalization on Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method [J] . Mihai G. Burzo, Pavel L. Komarov, Peter E. Raad Journal of Heat Transfer . 2002,第6期

机译：用瞬态热反射法研究表面金属化对热导率测量的影响
2. Influence of the metallic absorption layer on the quality of thermal conductivity measurements by the transient thermo-reflectance method [J] . Mihai G. Burzo, Pavel L. Komarov, Peter E. Raad Microelectronics journal . 2002,第9期

机译：金属吸收层对瞬态热反射法测量导热系数的影响
3. Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon [J] . Pavel L. Komarov, Mihai G. Burzo, Gunhan Kaytaz, Microelectronics journal . 2003,第12期

机译：瞬态热反射法测量的是金属化天然和同位素纯硅的导热系数和界面电阻
4. A study of the effect of surface metalization on the thermal conductivity measurements by the transient thermo-reflectance method [C] . Mihai G. Burzo, Pavel L. Komarov, Peter E. Raad ASME International Mechanical Engineering Congress and Exposition . 2002

机译：表面金属化对瞬态热反射法导热测量的影响研究
5. SIMULTANEOUS MEASUREMENT OF THE THERMAL CONDUCTIVITY AND THERMAL DIFFUSIVITY OF SINGLE AND TWO-PHASE MATERIALS USING THE TRANSIENT HOT WIRE METHOD. [D] . GLATZMAIER, GREGORY CONRAD. 1987

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机译：高温金属的热导率Ⅱ。铀的热导率：初步研究

A STUDY OF THE EFFECT OF SURFACE METALIZATION ON THE THERMAL CONDUCTIVITY MEASUREMENTS BY THE TRANSIENT THERMO-REFLECTANCE METHOD

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