首页> 外文会议>2010 27th International Conference on Microelectronics Proceedings >Effect of temperature on the electronic current of two dimensional quantum well in AlGaN/GaN high electron mobility transistors (HEMT)
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Effect of temperature on the electronic current of two dimensional quantum well in AlGaN/GaN high electron mobility transistors (HEMT)

机译:温度对AlGaN / GaN高电子迁移率晶体管(HEMT)中二维量子阱电子电流的影响

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摘要

An analytical-numerical model for the electronic current of two dimensional quantum well AlGaN/GaN in HEMTs has been developed in this paper that is capable of accurately predicting the effect of temperature on the electronic current of two dimensional quantum well. Salient futures of the model are incorporated of fully and partially occupied sub-bunds in the interface quantum well. In addition temperature dependent of band gap, quantum well electron density, threshold voltage, mobility of electron, dielectric constant, polarization induce charge density in the device are also take in to account. The calculated model results are in very good agreement with existing experimental data for HEMTs device.
机译:本文建立了HEMT中二维量子阱AlGaN / GaN电子电流的解析数值模型,该模型能够准确预测温度对二维量子阱电子电流的影响。该模型的显着未来被纳入了界面量子阱中的全部和部分占据的外滩。此外,还考虑了取决于带隙的温度,量子阱电子密度,阈值电压,电子迁移率,介电常数,极化感应器件中的电荷密度。计算得出的模型结果与HEMTs设备的现有实验数据非常吻合。

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