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首页> 外文会议>2012 2nd International Conference on Developments in Renewable Energy Technology >The significance of substrate surfaces in flexible thin film CdTe solar cells fabrication
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The significance of substrate surfaces in flexible thin film CdTe solar cells fabrication

机译：基板表面在柔性薄膜CdTe太阳能电池制造中的意义

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Thin film CdTe solar cells have been recognized as reliable alternative for the manufacturing of cost effecient photovoltaic solar cells of the future, due to its excellent absorber characteristics and simple, low-cost manufacturability. However, for the attainment of higher cell performances, additional studies are needed to increase cell efficiency through further development of better quality films and new fabrication processes. In substrate-structured CdTe thin film solar cells, the CdTe absorber is deposited directly onto the substrate or through a back contact layer. But the quality of deposited film is believed to depend on the type and smoothness of the substrate. In this work CdTe was deposited on different substrates by RF sputtering and the effects on the deposited films were studied in terms of their structural and morphological forms. The substrates used are pure molybdenum sheets (Mo), molybdenum-sputtered molybdenum (Mo/Mo), molybdenum-sputtered polyimide (PI/Mo) and molybdenum-sputtered glass (glass/Mo). The characterization tools used include XRD, SEM and AFM. The results show that all surfaces produced uniform, compact and pinhole free films; however, those on smoother surfaces produced larger as-deposited grain sizes of up to1.7μm as against 1.3 for rougher surfaces. Non-uniformities such as overgrowth and voids were observed, but only films on PI showed evidence of cracking and peel-offs.
机译：薄膜CdTe太阳能电池由于其出色的吸收特性和简单，低成本的可制造性，已被公认为是未来制造经济高效的光伏太阳能电池的可靠替代品。但是，为了获得更高的电池性能，还需要进行其他研究，以通过进一步开发质量更高的薄膜和新的制造工艺来提高电池效率。在衬底结构的CdTe薄膜太阳能电池中，CdTe吸收剂直接沉积在衬底上或通过背接触层沉积。但是据信沉积膜的质量取决于基底的类型和光滑度。在这项工作中，CdTe通过RF溅射沉积在不同的衬底上，并根据其结构和形态研究了对沉积膜的影响。所使用的基材为纯钼片（Mo），溅射钼的钼（Mo / Mo），溅射钼的聚酰亚胺（PI / Mo）和溅射钼的玻璃（玻璃/ Mo）。使用的表征工具包括XRD，SEM和AFM。结果表明，所有表面均产生均匀，致密且无针孔的薄膜；然而，在较光滑表面上的那些产生的沉积时晶粒尺寸最大为1.7μm，而在较粗糙表面上则为1.3。观察到不均匀性，例如过度生长和空隙，但是只有PI上的薄膜显示出裂纹和剥离的迹象。

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