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首页> 外文会议>2012 38th IEEE Photovoltaic Specialists Conference. >Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations
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Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations

机译：玻璃光学计量，可离线和在线配置60 cm×120 cm CdTe光伏电池板

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Through-the-glass spectroscopic ellipsometry (SE) has been applied in mapping analyses of 60 cm × 120 cm panels consisting of soda-lime glass coated with a four-layer transparent conducting oxide (TCO) stack and a two-layer CdS/CdTe photovoltaic (PV) heterojunction. Both off-line and on-line measurement configurations have been evaluated, using a rotating compensator for modulation of the incident polarization state and a multichannel detection system for high speed spectroscopy. Because of the longer time available for signal averaging during off-line measurements, the off-line capability assists in model development and qualification of the on-line capability, which operates at a higher speed and a limited data point density over the panel area. For on-line analysis, the panel is lying film side up on a linear conveyer and is moved past an SE mapping station. In this case, the ellipsometer heads traverse from side to side beneath the panel for through-the-glass measurements. Comparisons of off-line and on-line analyses indicate good agreement in the variations of the CdS layer effective thickness over the panel. The deduced CdS effective thickness, which includes components of the bulk and interface layers, is found to be a robust parameter in both analyses, and is also critical for predicting light collection in CdTe PV modules.
机译：玻璃光谱椭偏仪（SE）已用于60 cm×120 cm面板的制图分析，该面板由涂有四层透明导电氧化物（TCO）叠层和两层CdS / CdTe的钠钙玻璃组成光伏（PV）异质结。离线和在线测量配置均已进行了评估，使用旋转补偿器调制入射偏振态，并使用多通道检测系统进行高速光谱分析。由于在离线测量期间可用于信号平均的时间更长，因此离线功能有助于模型开发和在线功能的鉴定，在线功能在面板区域上以较高的速度和有限的数据点密度运行。为了进行在线分析，面板将薄膜面朝上放在线性输送机上，然后移动通过SE标测站。在这种情况下，椭偏仪的探头在玻璃板的下方从一侧移到另一侧以进行玻璃测量。离线分析和在线分析的比较表明，面板上CdS层有效厚度的变化具有良好的一致性。推论出的CdS有效厚度（包括体层和界面层的成分）在两个分析中都是可靠的参数，对于预测CdTe PV模块中的光收集也至关重要。

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