Dept. of Mechatron., Energy Aerosp. Eng., Nat. Defense Univ., Taichung, Taiwan;
finite element analysis; power semiconductor diodes; semiconductor device packaging; temperature distribution; thermal management (packaging); thermal stresses; ANSYS FEM software; boundary conditions; diode packaging; equivalent material property equations; global-local methodology; mechanical property analyses; power 5 W; power adapter; power diodes; temperature distribution measurements; thermal stress analyses; thermo-stress analyses; Adaptation models; Bridges; Finite element analysis; Packaging; Schottky diodes;
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机译:SUS 420F钢的高功率二极管激光表面熔化:显微组织和力学性能的研究
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机译:压铸质量对高功率发光二极管包装机械和热性能的影响
机译:哈氏合金X在典型气冷堆环境中的力学性能变化