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Total Angle Resolved Scattering Characterization for Ultra-fine Finished Surface Areal-Topography

机译:超细精加工表面区域形貌的总角度分辨散射特性

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摘要

In this study, the total angle resolved scattering (T-ARS) based on the light scattering method is suggested. To characterize surface areal-topography with nano-defects using the T-ARS method we have developed an automated 3D-scattering measurement system that enables to detect the scattered light from a super-smooth surface in total directions. In order to verify the feasibility of the T-ARS method, the analysis of surface areal-topography based on 3D light scattering measurement is performed using a platinum-coated glass lens mold with an ultra-fine finished surface.
机译:在这项研究中,建议基于光散射方法的总角度分辨散射(T-ARS)。为了使用T-ARS方法表征具有纳米缺陷的表面区域形貌,我们开发了一种自动3D散射测量系统,该系统可以检测整个方向上来自超光滑表面的散射光。为了验证T-ARS方法的可行性,使用具有超细精加工表面的镀铂玻璃透镜模具对基于3D光散射测量的表面形貌进行了分析。

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