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Investigation of microstructure and optical property of high power LED based on rapid thermal cycling

机译:基于快速热循环的大功率LED的微观结构和光学性能研究

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The objective of this paper is to investigate the effect of rapid thermal cycling on microstructure and optical property (luminous flux and luminous efficiency) of high power light emitting diode (LED) by induction heating. Under an application of induction heating as rapid heating source, the specimens that were being non-operating and operating life tests in the experiment were rapidly heated and cooled based on a control system that employs a fuzzy logic algorithm, respectively. The optical performances, including luminous flux, luminous efficiency and radiant power of two kinds of LED specimens were compared and analyzed. It was found that the rapid thermal cycling have similar evident influence on them. The results showed that the color purity of LED was also descended, the correlated color temperature (CCT) was also risen, but their changing rate and extents are different. The high and low temperature distribution in LED chip was simulated by finite element modeling (FEM) which is helpful for the failure analysis and design of the reliability of the LED packaging. The microstucrue of LED chips are analyzed after different rapid thermal cycling time. The results are showed that rapid thermal cycling can affect greatly the LED properties and interface microstructures. All the results indicate that this approach to rapid thermal cycling by using rapid heating source is feasible to investigate the optical performance of high power LED, so it can also effectively verify the reliability of LED devices.
机译:本文的目的是研究快速热循环通过感应加热对大功率发光二极管(LED)的微观结构和光学性质(光通量和发光效率)的影响。在感应加热作为快速加热源的应用下,分别基于采用模糊逻辑算法的控制系统,快速加热和冷却了实验中处于非工作状态和工作寿命测试的样品。比较和分析了两种LED样品的光通量,发光效率和辐射功率。发现快速热循环对其具有相似的明显影响。结果表明,LED的色纯度也下降,相关色温(CCT)也升高,但它们的变化率和变化程度不同。通过有限元建模(FEM)对LED芯片的高温和低温分布进行了仿真,这有助于LED封装的失效分析和可靠性设计。经过不同的快速热循环时间后,分析LED芯片的微结构。结果表明,快速的热循环会极大地影响LED的性能和界面的微观结构。所有结果表明,这种利用快速加热源进行快速热循环的方法对于研究大功率LED的光学性能是可行的,因此也可以有效地验证LED器件的可靠性。

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