A novel random approach to diagnostic test generation

机译：诊断测试生成的新型随机方法

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The importance of diagnostic test generation cannot be overemphasized as it is increasingly becoming important for diagnosing the complex circuits designed today. One approach is to use a test set that is generated originally for testing as the starting point so the diagnostic generator uses a deterministic approach to find diagnostic vectors that are then added to the original test set. But the challenge with the deterministic approach is with its high computational cost and time. We propose a novel semi-random diagnostic generator which is inspired from the simplicity and speed a random ATPG for test generation has. Two methods are presented and our investigation shows that this semi-random approach improves the diagnostic resolution and has a lesser computational cost and time.

机译：诊断测试生成的重要性不可过分强调，因为它对于诊断当今设计的复杂电路越来越重要。一种方法是使用最初为测试而生成的测试集作为起点，因此诊断生成器使用确定性方法查找诊断向量，然后将其添加到原始测试集中。但是确定性方法面临的挑战是其高昂的计算成本和时间。我们提出了一种新颖的半随机诊断生成器，该生成器的灵感来自于随机ATPG用于测试生成的简单性和速度。提出了两种方法，我们的研究表明，这种半随机方法可以提高诊断分辨率，并减少计算成本和时间。

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来源
《2016 IEEE Nordic Circuits and Systems Conference》|2016年|1-4|共4页
会议地点 Copenhagen(DK)
作者
Emmanuel Ovie Osimiry; Raimund Ubar; Sergei Kostin; Jaan Raik;
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作者单位

Department of Computer Engineering, TTU, Akadeemia tee 15A, 12618 Tallinn, Estonia;

Department of Computer Engineering, TTU, Akadeemia tee 15A, 12618 Tallinn, Estonia;

Department of Computer Engineering, TTU, Akadeemia tee 15A, 12618 Tallinn, Estonia;

Department of Computer Engineering, TTU, Akadeemia tee 15A, 12618 Tallinn, Estonia;

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原文格式 PDF
正文语种 eng
中图分类
关键词
Circuit faults; Benchmark testing; Computational efficiency; Integrated circuits; Cost function; Mathematical model;

机译：电路故障;基准测试;计算效率;集成电路;成本函数;数学模型;

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A novel random approach to diagnostic test generation

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