High-sensitivity micro-magnetic probe for the applications of safety and security

机译：高灵敏度的微磁探头，用于安全和安保的应用

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摘要

This paper presents a high-resolution near-field magnetic sensing system for nondestructive inspection applications of safety and security. The system includes a probe chip based on a 0.18-μm 5-metal-layer CMOS process technology and a micro-position calibration mechanism. The probe chip includes a magnetic pick-up coil followed by a 3-stage low-noise amplifier to amplify the induced voltage on the coil. A mechanical scanning system with an ability of micro-position calibration is to allow high-precision calibration and micro-scanning operation. For the security application, a high spacial resolution magnetic scanning experiment is conducted on a micro-strip line and on the surface of a cryptographic FPGA running 128-bit Advanced Encryption Standard algorithm. In addition, the magnetic probe is used for safety applications for fault detection in both low-power devices and power electric circuits.

机译：本文提出了一种用于安全性和安全性的无损检测应用的高分辨率近场磁传感系统。该系统包括一个基于0.18-μm五金属层CMOS工艺技术的探针芯片和一个微位置校准机制。探针芯片包括一个电磁拾波线圈，后接一个三级低噪声放大器，以放大线圈上的感应电压。具有微位置校准功能的机械扫描系统将允许高精度校准和微扫描操作。对于安全应用，在微带线上和运行128位高级加密标准算法的加密FPGA的表面上进行了高空间分辨率的磁扫描实验。此外，电磁探头还用于安全应用中，以在低功率设备和电源电路中进行故障检测。

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来源
《2017 7th International Conference on Integrated Circuits, Design, and Verification》|2017年|10-15|共6页
会议地点 Hanoi(VN)
作者
Nguyen Ngoc Mai-Khanh; Tetsuya Iizuka; Shigeru Nakajima; Kunihiro Asada;
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作者单位

The VLSI Design and Education Center (VDEC), The Univ. of Tokyo, Tokyo, Japan;

The Graduate School of Engineering, The Univ. of Tokyo, Tokyo, Japan;

Device Analysis, Chigasaki, Japan;

The Graduate School of Engineering, The Univ. of Tokyo, Tokyo, Japan;

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会议组织
原文格式 PDF
正文语种 eng
中图分类
关键词
Probes; Calibration; Magnetic circuits; Field programmable gate arrays; Magnetic devices; Gain; Sensors;

机译：探头;校准;磁路;现场可编程门阵列;磁器件;增益;传感器;;

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High-sensitivity micro-magnetic probe for the applications of safety and security

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