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A contact resistance measurement setup for the study of novel contacts

机译：用于研究新型触点的接触电阻测量装置

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Contacts are a key component of most modern electrical and electronic systems, they are found in connectors, switches and relays. Recently it has been proposed the usage of new composite materials in contacts; this demands the study and characterization of these materials to assess their performance. From the electrical perspective, the most important aspect is the resistance and its variations due to mechanical and chemical phenomena. The measurement of contact resistance carries some challenges due to the low values to be measured and the limitations imposed by dry circuit testing. In this article, we present a setup suitable for making low resistance measurements as those found on electrical contacts.

机译：接触器是大多数现代电气和电子系统的关键组件，可以在连接器，开关和继电器中找到。最近，有人提出在触点中使用新的复合材料。这要求对这些材料进行研究和表征，以评估其性能。从电气角度来看，最重要的方面是电阻及其由于机械和化学现象而产生的变化。接触电阻的测量由于要测量的值低以及干电路测试的局限性而带来一些挑战。在本文中，我们介绍一种适合进行低电阻测量的设置，如在电触点上发现的那些。

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来源
《2017 IEEE URUCON Conference》|2017年|1-4|共4页
会议地点 Montevideo(UY)
作者
Rafael Puyol; Sebastián Suárez;
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作者单位

Electrical Engineering Department Universidad Católica del Uruguay Montevideo, Uruguay;

Department of Material Science and Engineering Saarland University Saarbrücken, Germany;

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原文格式 PDF
正文语种 eng
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Three-dimensional displays;

机译：三维显示器；;

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1. Automated data acquisition setup for interfacial tension and capacitance measurements at hg-solution contacts under lab VIEW control [J] . Bozatzidis A, Anastopoulos AG, Laopoulos T Electroanalysis . 2007,第16期

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2. Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method [J] . P. N. Vinod Journal of materials science . 2011,第9期

机译：通过三点探针法和TLM方法测量硅太阳能电池中丝网印刷的Ag厚膜触点的比接触电阻
3. Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method [J] . P. N. Vinod Journal of Materials Science: Materials in Electronics . 2011,第9期

机译：通过三点探针法和TLM方法测量硅太阳能电池中丝网印刷的Ag厚膜触点的比接触电阻
4. A contact resistance measurement setup for the study of novel contacts [C] . Rafael Puyol, Sebastián Suárez IEEE URUCON (Conference) . 2017

机译：用于研究新型触点的接触电阻测量设置
5. Engineering Ohmic Contacts to III-V, III-N, and 2D Dichalcogenides: The Impact of Annealing and Surface Preparation on Contact Resistance [D] . Abraham, Michael. 2017

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6. Skin Temperature Measurement Using Contact Thermometry: A Systematic Review of Setup Variables and Their Effects on Measured Values [O] . Braid A. MacRae, Simon Annaheim, Christina M. Spengler, -1

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7. A contact resistance measurement setup for the study of novel contacts [O] . Rafael Puyol, Sebastian Suarez 2017

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8. Specific Contact Resistance Measurements of Ohmic Contacts to SemiconductingDiamond [R] . Hewett, C. A., Taylor, M. J., Zeidler, J. R., 1995

机译：欧姆接触半导体金刚石的特定接触电阻测量

A contact resistance measurement setup for the study of novel contacts

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