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Analysis of Heavy Metals in Solid Industrial Wastes by ICP-OES, ICP-VGA and XRF

机译:ICP-OES,ICP-VGA和XRF分析固体工业废料中的重金属

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The chemical composition of Solid Industrial Wastes (SIW) has been carefully and reliably determined by a range of analytical techniques, such as X-ray Fluorescence (XRF) analysis for general inorganic composition, Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES) for major elements and heavy metals, and ICP-VGA (Vapor Generation Analysis) for mercury determination throughout the sampling period. The concentrations of leachable heavy metals were also successfully determined by Toxicity Characteristics Leaching Procedure (TCLP) tests on treated filter cake and stabilised sludge samples. The chemical composition of the treated SIW was compared against EPA Victoria regulatory requirement for hazard classification.
机译:固体工业废物(SIW)的化学成分已通过一系列分析技术进行了仔细而可靠的确定,例如用于一般无机成分的X射线荧光(XRF)分析,电感耦合等离子体发射光谱(ICP-OES)用于主要元素和重金属,ICP-VGA(蒸气产生分析)用于在整个采样期间测定汞。还通过对处理后的滤饼和稳定污泥样品进行的毒性特征浸出程序(TCLP)测试成功确定了可浸出重金属的浓度。将经过处理的SIW的化学成分与EPA Victoria对危害分类的监管要求进行了比较。

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