首页> 外文会议>2nd International EUSPEN Conference on Precision Engineering Nanotechnology Vol.1, May 27th-31st, 2001, Turin, Italy >Accurate optical surface profilometer based on Mirau-type interferometric microscope
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Accurate optical surface profilometer based on Mirau-type interferometric microscope

机译:基于Mirau型干涉显微镜的精密光学表面轮廓仪

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Optical surface profilometer based on Mirau-type interferometric microscope, whose interference fringe spacing is directly and absolutely calibrated, has been designed and constructed. The standard deviation of the fringe spacing determination is about 0.2%. Just after the determination of the fringe spacing, the 3D surface profile of a sample can be measured using the phase-shifting technique. Repeatability of surface profile measurements is below sub-nanometer. Four kinds of standard samples with different step heights (certified values; 19.2, 45.9, 91.1 and 173.9nm) are measured by our instrument and the effectiveness of our method to determine the fringe spacing is confirmed.
机译:设计并构建了基于Mirau型干涉镜的光学表面轮廓仪,其干涉条纹间距得到了直接且绝对的校准。条纹间距确定的标准偏差约为0.2%。在确定条纹间距之后,可以使用相移技术测量样品的3D表面轮廓。表面轮廓测量的可重复性低于亚纳米。用我们的仪器测量了四种具有不同台阶高度(标准值; 19.2、45.9、91.1和173.9nm)的标准样品,并证实了我们确定条纹间距的方法的有效性。

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