首页> 外文会议>2nd International EUSPEN Conference on Precision Engineering Nanotechnology Vol.1, May 27th-31st, 2001, Turin, Italy >Wavelength stabilised diode laser interferometer for calibration of length measuring instruments
【24h】

Wavelength stabilised diode laser interferometer for calibration of length measuring instruments

机译:波长稳定二极管激光干涉仪,用于校准长度测量仪器

获取原文
获取原文并翻译 | 示例

摘要

The main contributions to the uncertainty of commercial available devices for the calibration of simple length measuring instruments are the wavelength uncertainty and the thermal expansion of the measuring piece. We have reduced this contributions with a diode laser with inherent compensation of changes of the refractive index of air and the temperature of the piece to be measured.
机译:用于简单长度测量仪器校准的商用设备不确定度的主要贡献是波长不确定度和测量件的热膨胀。我们通过二极管激光器减少了这种影响,该二极管激光器固有地补偿了空气的折射率和待测工件的温度变化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号