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Investigation on the susceptibility of two-stage voltage comparators to EMI

机译:两级电压比较器对EMI的敏感性研究

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摘要

This paper deals with the susceptibility of a common CMOS voltage comparators to radio frequency interference. Specifically, the circuit topology that comprise a differential stage cascaded with a common source gain stage is considered. The detrimental effect of the RFI superimposed onto the nominal input signals is investigated through time domain computer simulations and through experiments carried out on a test chip.
机译:本文探讨了常见的CMOS电压比较器对射频干扰的敏感性。具体地,考虑包括与公共源增益级级联的差分级的电路拓扑。通过时域计算机仿真和在测试芯片上进行的实验,研究了叠加在标称输入信号上的RFI的有害影响。

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