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首页> 外文会议>Achievements in magnetism >Magneto-Optical Properties Of Multilayer Nanostructures With Composite Magnetic Layers Near Percolation Threshold
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Magneto-Optical Properties Of Multilayer Nanostructures With Composite Magnetic Layers Near Percolation Threshold

机译：复合磁层接近渗流阈值的多层纳米结构的磁光特性

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摘要

Spectra and field dependencies of transversal Kerr effect (TKE) for [(Co_(45)Fe_(45)Zr_(10))_(46)(Al_2O_3)_(54)(X)/Si(Y)]n multilayers (ML) with thin layers (X < 2,5 nm; Y < 3,5 nm) have been studied in the energy range 0,5 - 4,0 eV. It was found that TKE field dependencies in the nearest infrared (IR) and visible energy ranges exhibit anomalous behavior. TKE spectra measured in weak (~30 Oe) and strong (~2 kOe) magnetic fields were essentially different. It was shown that magneto-optical response of multilayered structure composite-silicone is the sum of magnetic composite layers and composites formed on interface contributions. And these contributions may have an opposite sign of TKE. Interface magnetic states depend on composite and semiconductor layers' thicknesses and FM phase concentration in composite layers.
机译：[[Co_（45）Fe_（45）Zr_（10））_（46）（Al_2O_3）_（54）（X）/ Si（Y）] n多层薄膜的横向Kerr效应（TKE）的光谱和场依赖性已经研究了在0.5-4.0 eV的能量范围内具有薄层（X <2.5 nm; Y <3.5 nm）的ML）。发现在最近的红外（IR）和可见能量范围内的TKE场依赖性显示出异常行为。在弱（〜30 Oe）和强（〜2 kOe）磁场中测得的TKE光谱本质上是不同的。结果表明，多层结构复合有机硅的磁光响应是磁性复合层和复合材料在界面作用下形成的总和。这些贡献可能与TKE相反。界面磁态取决于复合层和半导体层的厚度以及复合层中的FM相浓度。

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