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Development and assessment of image reconstruction algorithms using a low-cost bench-microscope based on a linear CMOS image sensor

机译:使用基于线性CMOS图像传感器的低成本台式显微镜开发和评估图像重建算法

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We aim at establishing a bench-microscope based on a linear sensor as a versatile research tool for the development and assessment of image reconstruction algorithms. Therefore we built a laboratory prototype of a scanning-stage bright-field microscope. It is epi-illuminated with a white-light source. The detector is a linear CMOS image sensor. A stand-alone sensor readout module has been developed and integrated in this low-cost bench-microscope. Through lateral scanning along one axis it acquires two-dimensional (2D) images of the specimen that suffer from substantial contributions from out-of-focus portions. This haze in the optical slices will be removed or significantly diminished using computational methods. As the output performance of these methods is extremely dependent on the imaging quality of the microscope prototype, two types of measurement to assess it are described. Axial discrimination will be evaluated along with the development of computational methods. Nevertheless a plane reflector was scanned along z-axis to measure intrinsic axial response of this microscope arrangement. Results of overall system resolution and contrast are presented. At last, preliminary results of three-dimensional (3D) image reconstruction using a simple algorithm to find the best-in-focus image through the determination of maximum intensity are presented. Raw bright-field images from wire bond of an integrated circuit (IC) were used.
机译:我们旨在建立一个基于线性传感器的台式显微镜,作为开发和评估图像重建算法的多功能研究工具。因此,我们构建了扫描台明场显微镜的实验室原型。它被白色光源落射照明。该检测器是线性CMOS图像传感器。一个独立的传感器读出模块已经开发并集成在这种低成本台式显微镜中。通过沿一个轴的横向扫描,它可以获取标本的二维(2D)图像,这些图像主要受失焦部分的影响。光学切片中的雾度将使用计算方法消除或显着减少。由于这些方法的输出性能非常依赖于显微镜原型的成像质量,因此介绍了两种评估方法。轴向歧视将随着计算方法的发展进行评估。然而,沿z轴扫描平面反射器以测量该显微镜装置的固有轴向响应。给出了整体系统分辨率和对比度的结果。最后,给出了使用简单算法通过确定最大强度来找到最佳聚焦图像的三维(3D)图像重建的初步结果。使用了来自集成电路(IC)引线键合的原始明场图像。

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