Simulations of avalanche breakdown statistics: probability and timing

著录项

• 来源
  《Advanced photon counting techniques IV》|2010年|P.76810K.1-76810K.8|共8页
• 会议地点 Orlando FL(US)
• 作者

  Jo Shien Ng; Chee Hing Tan; John P R David;

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• 作者单位

  Dept. of Electronic Electrical Engineering, University of Sheffield, Sir Frederick Mappin Building, Mappin Street, Sheffield S1 3JD, UK;

  rnDept. of Electronic Electrical Engineering, University of Sheffield, Sir Frederick Mappin Building, Mappin Street, Sheffield S1 3JD, UK;

  rnDept. of Electronic Electrical Engineering, University of Sheffield, Sir Frederick Mappin Building, Mappin Street, Sheffield S1 3JD, UK;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 光电子技术、激光技术;
• 关键词

  avalanche photodiodes; breakdown; probability; jitter; tunneling;

  机译：雪崩光电二极管；分解;可能性;抖动挖洞;