RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS

机译：多层光学中粉末数据的RIETVEL精修

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An empirical evaluation of powder diffraction data collected using multilayer optics was performed by determining the peak shapes as a function of angle and performing Rietveld refinements. Data collected using a parabolic multilayer optic in the incident beam and either a long Soller collimator or a flat multilayer optic in the diffracted beam were evaluated. NIST Standard Reference Material SRM640C (silicon) was used in the analysis. The results demonstrate that parallel beam data can be easily modeled using Pearson VII or pseudo-Voigt profiles and the Rietveld refinements are reliable. The profile shapes obtained using two multilayer optics are unusual and warrant further investigation.

机译：通过确定峰形随角度变化并进行Rietveld精炼，对使用多层光学器件收集的粉末衍射数据进行了经验评估。使用入射光束中的抛物线多层光学器件和衍射光束中的长Soller准直仪或平坦的多层光学器件，对收集的数据进行了评估。分析中使用了NIST标准参考材料SRM640C（硅）。结果表明，可以使用Pearson VII或伪Voigt轮廓轻松地建模平行光束数据，并且Rietveld改进是可靠的。使用两个多层光学器件获得的轮廓形状不寻常，需要进一步研究。

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来源
《Advances in X-ray analysis (ICDD2001)》|2001年|p.166-171|共6页
会议地点 Steamboat Springs CO(US);Steamboat Springs CO(US);Steamboat Springs CO(US)
作者
Scott T. Misture;
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作者单位

NYS College of Ceramics at Alfred University, Alfred, NY 14802;

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原文格式 PDF
正文语种 eng
中图分类 X射线、紫外线、红外线;
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机译：立方MOF [{Ca（H_2O）_6} {CaGd（双氧乙酸）3} 2]·4H_2O的结构。从常规和同步加速器X射线粉末衍射数据的Rietveld精炼与单晶X射线衍射数据的标准精炼获得的结构模型之间的比较
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3. Dependence of structural data from sin theta/lambda, extension in Rietveld refinement of virtually texture-free laboratory X-ray powder-diffraction data [J] . Ballirano Paolo Periodico di mineralogia . 2014,第1期

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4. RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS [C] . Scott T. Misture Annual conference on applications of X-ray analysis . 2002

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机译：Zn（2）TiO（4），MgGa（2）O（4）-Mg（2）GeO（4）尖晶石固溶体和β-Mg（3）Ga（2）GeO的结构，阳离子有序和过渡行为（8），通过Rietveld精修X射线或中子衍射数据和O-17 MAS NMR。
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机译：X射线粉末衍射数据识别和结构阐明未知的石头RIETVELD细化方法
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机译：TiN粉末弹性中子衍射数据的Rietveld精修

RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS

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