NANOSCALE VISCOELASTIC CHARACTERIZATION USING TAPPING MODE AFM

机译：攻丝模式原子力显微镜的纳米尺度粘弹性表征

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By using an analytical model which includes the attractive, repulsive and damping forces, the complicated features in tapping mode AFM have been represented and supported by experiment. The AFM measured features are dominated by two regimes: adhesion force control or elastic force control. Due to the nonlinear character of the AFM vibration system, the transition between the two regimes depends on the system parameters and damping.

机译：通过使用包含吸引力，排斥力和阻尼力的分析模型，通过攻丝模式AFM的复杂特征已经得到了实验表示和支持。原子力显微镜测量的特征主要由两种机制控制：粘附力控制或弹力控制。由于AFM振动系统的非线性特性，两种状态之间的过渡取决于系统参数和阻尼。

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来源
《Annual Symposium on Quantitative Nondestructive Evaluation; 19980719-24; Snowbird,UT(US)》|1998年|P.1741-1748|共8页
会议地点 SnowbirdUT(US)
作者
L. Wang; K. Wu; S. I. Rokhlin;
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The Ohio State University Nondestructive Evaluation Program Edison Joining Technology Center 1248 Arthur E. Adams Drive, Columbus, OH 43221;

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原文格式 PDF
正文语种 eng
中图分类无损探伤仪器;
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机译：使用攻丝模式原子力显微镜的纳米尺度粘弹性表征

NANOSCALE VISCOELASTIC CHARACTERIZATION USING TAPPING MODE AFM

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