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首页> 外文会议>Conference on multiphoton microscopy in the biomedical sciences >FastFLIM, the all-in-one engine for measuring photoluminescence lifetime of 100 picoseconds to 100 milliseconds
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FastFLIM, the all-in-one engine for measuring photoluminescence lifetime of 100 picoseconds to 100 milliseconds

机译：FastFLIM，用于测量100皮秒至100毫秒光致发光寿命的多合一引擎

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摘要

Photoluminescence (PL) refers to light emission initiated by any form of photon excitation. PL spectroscopy and microscopy imaging has been widely applied in material, chemical and life sciences. Measuring its lifetime yields a new dimension of the PL imaging and opens new opportunities for many PL applications. In solar cell research, quantification of the PL lifetime has become an important evaluation for the characteristics of the Perovskite thin film. Depending upon the PL process (fluorescence, phosphorescence, photon upconversion, etc.), the PL lifetimes to be measured can vary in a wide timescale range (e.g. from sub-nanoseconds to microseconds or even milliseconds) - it is challenging to cover this wide range of lifetime measurements by a single technique efficiently. Here, we present a novel digital frequency domain (DFD) technique named FastFLIM, capable of measuring the PL lifetime from 100 ps to 100 ms at the high data collection efficiency (up to 140-million counts per second). Other than the traditional nonlinear least-square fitting analysis, the raw data acquired by FastFLIM can be directly processed by the model-free phasor plots approach for instant and unbiased lifetime results, providing the ideal routine for the PL lifetime microscopy imaging.
机译：光致发光（PL）是指由任何形式的光子激发引发的光发射。 PL光谱学和显微镜成像已广泛应用于材料，化学和生命科学领域。测量其寿命将产生PL成像的新维度，并为许多PL应用提供新的机会。在太阳能电池研究中，PL寿命的量化已成为钙钛矿薄膜特性的重要评估。根据PL过程（荧光，磷光，光子上转换等），要测量的PL寿命可能会在很宽的时间范围内变化（例如，从亚纳秒到微秒甚至是毫秒）-要覆盖这么宽的范围是很困难的单一技术有效地测量寿命范围。在这里，我们介绍了一种名为FastFLIM的新型数字频域（DFD）技术，该技术能够以高数据收集效率（每秒高达1.4亿计数）测量从100 ps到100 ms的PL寿命。除传统的非线性最小二乘拟合分析外，FastFLIM采集的原始数据可通过无模型相量图方法直接处理，以获取即时和无偏差的寿命结果，从而为PL寿命显微镜成像提供了理想的程序。

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