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AEDC's transportable direct-write scene generation test capability

机译:AEDC的可移动直接写入场景生成测试功能

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Abstract: A Transportable Direct Write Scene Generation (TDWSG) test capability has been developed at the Arnold Engineering Development Center (AEDC) for visible and IR focal plane array (FPA) testing which utilizes laser sources and two-axis acousto-optic deflectors. The objective of this effort is to provide a test and evaluation facility which will help reduce space sensor development risks by testing FPAs with their data subsystems against realistic mission scenarios in a space environment. The TDWSG's performance envelope covers both high- speed (100 $mu@s frame time) scanning and slower staring formats. A modular concept is used to address large (512 $MUL 512 pixel) FPAs. Scene inputs can be derived from various sources including the Strategic Scene Generation Model (SSGM). A continuance of this effort is being applied toward development of a fixed-site Scene Generation Test Capability (SGTC).!8
机译:摘要:Arnold工程开发中心(AEDC)已开发出可运输的直接写场景生成(TDWSG)测试功能,用于利用激光源和两轴声光偏转器的可见光和IR焦平面阵列(FPA)测试。这项工作的目的是提供一种测试和评估工具,通过针对太空环境中的实际任务场景测试FPA及其数据子系统来帮助降低空间传感器开发风险。 TDWSG的性能范围涵盖高速(100 $ mu @ s帧时间)扫描和较慢的凝视格式。模块化概念用于解决大型(512 $ MUL 512像素)FPA。场景输入可以来自各种来源,包括战略场景生成模型(SSGM)。持续不断的努力被用于开发固定现场的场景生成测试功能(SGTC)。!8

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