• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods >The method of determining the characteristic features of graphene oxides by Atomic Force Microscopy
【24h】

The method of determining the characteristic features of graphene oxides by Atomic Force Microscopy

机译：原子力显微镜测定石墨烯氧化物特征的方法

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

In this paper, we present the results of the measurements obtained using atomic force microscopy (AFM). The subject of research were the reduced graphene oxides which were obtained by oxidation (in first step) of the graphites and thermally reduction (in the second step). The three types of graphites (flake, scale and synthetic) and three different method of oxidation were used in the measurements. The special attention was paid to the height and horizontal sizes of the obtained material. The results was analysed and relevant conclusions were drawn from them.
机译：在本文中，我们介绍了使用原子力显微镜（AFM）获得的测量结果。研究的主题是通过石墨的氧化（第一步）和热还原（第二步）获得的还原石墨烯氧化物。测量中使用了三种类型的石墨（片状，鳞状和合成石墨）和三种不同的氧化方法。特别注意所得材料的高度和水平尺寸。分析结果并从中得出相关结论。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号