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首页> 外文会议>Conference on Interferometry in Space Pt.1, Aug 26-28, 2002, Waikoloa, Hawaii, USA >Diffraction hardware testbed and model validation
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Diffraction hardware testbed and model validation

机译：衍射硬件测试平台和模型验证

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摘要

Optical systems, which operate over a wide range of Fresnel numbers, are often times performance-limited by diffraction effects. In order to characterize such effects at the 40-100 picometer level, a diffraction testbed has been built which has the capability of measuring diffraction effects at this level. Concurrently, mathematical diffraction modeling tools have been developed that propagate an input wavefront through an optical train, while retaining amplitude and phase information at a grid resolution sufficient for yielding picometer-resolution diffraction test data. This paper contains a description of this diffraction hardware testbed, the diffraction modeling approach, and a comparison of the modeled and hardware test results, which then serves as validation of the diffraction modeling methodology.
机译：在广泛的菲涅耳数范围内运行的光学系统通常受衍射效应的限制。为了表征在40-100皮米级别的这种影响，已经建立了衍射测试台，该测试台具有在该级别测量衍射效果的能力。同时，已经开发了数学衍射建模工具，该工具可以通过光学系统传播输入波前，同时以足以产生皮米分辨率衍射测试数据的网格分辨率保留幅度和相位信息。本文包含对这种衍射硬件测试平台的描述，衍射建模方法，以及对建模和硬件测试结果的比较，然后可以对衍射建模方法进行验证。

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