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首页> 外文会议>Conference on Interferometry in Space Pt.1, Aug 26-28, 2002, Waikoloa, Hawaii, USA >The Micro-Arcsecond Measurement Testbed and Its Relationship to the Space Interferometer Mission
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The Micro-Arcsecond Measurement Testbed and Its Relationship to the Space Interferometer Mission

机译：微弧秒测量试验台及其与空间干涉仪任务的关系

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This paper describes the relationship between the Space Interferometer Mission (SIM) and the Micro-Arcsecond Measurement Testbed (MAM). MAM is necessary because differences exist between the starlight and the metrology measurements through the SIM instrument optical path. The goal of MAM is to establish the methodologies required to reduce these differences. The targeted SIM instrument performance requires these differences to be at the pico-meter level. Starlight and metrology difference errors can be grouped into two categories: field dependent and field independent errors. The field independent errors are either random (i.e., vibration) or drift (i.e., thermal mirror warping). The field dependent errors introduce differences between metrology and starlight that change as a function of "look" angle. An example field dependent error is the different diffraction effects on the two beams as the delay line slews. SIM's fundamental error mitigation approach is to reduce the field independent errors down to the prescribed error budget levels, then calibrate out the remaining field dependent portion. The paper describes the recipe to generate the MAM error budget. Since MAM is inherently a subset of SIM, the MAM testbed addresses a subset of the total SIM error budget. The paper describes the approach to determining the relevant MAM portion. In addition, it describes the derivation of the overall MAM error budget, including allocations for the pseudo star errors. The paper maps the SIM observing scenario to a MAM test measurement. A successful MAM measurement will be defined in terms of the actual measurements, the metric applied and its relationship to the MAM error budget.
机译：本文介绍了空间干涉仪任务（SIM）与微弧秒测量试验台（MAM）之间的关系。 MAM是必需的，因为通过SIM仪器的光路，星光和度量衡测量之间存在差异。 MAM的目标是建立减少这些差异所需的方法。目标SIM仪器性能要求这些差异在皮米级别。星光和计量学差异误差可分为两类：与场有关的误差和与场无关的误差。与场无关的误差可以是随机的（即振动）或漂移的（即热镜翘曲）。与场有关的误差会引入计量学和星光之间的差异，这些差异会随着“视角”角度的变化而变化。一个示例性的取决于场的误差是，随着延迟线的倾斜，两个光束的衍射效果不同。 SIM的基本错误缓解方法是将与现场无关的错误降低到规定的错误预算水平，然后校准其余与现场相关的部分。本文介绍了生成MAM错误预算的方法。由于MAM本质上是SIM的子集，因此MAM测试平台解决了总SIM错误预算的子集。本文介绍了确定相关MAM部分的方法。此外，它描述了整个MAM错误预算的推导，包括伪星错误的分配。本文将SIM观测方案映射到MAM测试测量。将根据实际测量，应用的度量及其与MAM错误预算的关系来定义成功的MAM测量。

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