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Fitting Method for Analyzing Polarized X-rays on CCD Camera

机译:CCD相机上偏振X射线分析的拟合方法

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摘要

CCDs can function as the X-ray spectrometer by counting the number of electrons created by the ionization of semiconductor atoms following the photoelectric absorpion of a X-ray photon. In order to measure the incident X-ray energy correctly, we have to sum up all the electrons split over several pixels, thus the grade method is conventionally used. We will discuss the possible altenrative to this method - the fitting method -, which has several advantages over the grade methode. By applying this method to the data taken with our CCD chip, we will show that the fitting method can improve the quantum efficiency, is appliable to the analysis of polarized X-ray events, and gives us insights on the structure of CCDs.
机译:CCD可以通过计算由X射线光子的光电吸收后半导体原子电离产生的电子数来充当X射线光谱仪。为了正确地测量入射的X射线能量,我们必须对在几个像素上分割的所有电子求和,因此通常使用分级方法。我们将讨论这种方法的可能替代方法-拟合方法-与分级方法相比有几个优点。通过将这种方法应用于我们的CCD芯片获取的数据,我们将证明该拟合方法可以提高量子效率,适用于偏振X射线事件的分析,并为我们提供有关CCD结构的见解。

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